Standard Technical specification · SIS-ISO/TS 25138:2011

Surface chemical analysis - Analysis of metal oxide films by glow discharge optical emission spectrometry (ISO/TS 25138:2010, IDT)

Status: Withdrawn

· Replaced by: SIS-ISO/TS 25138:2019
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Standard Technical specification · SIS-ISO/TS 25138:2011

Surface chemical analysis - Analysis of metal oxide films by glow discharge optical emission spectrometry (ISO/TS 25138:2010, IDT)
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Scope
This Technical Specification describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Subjects

Chemical analysis (71.040.40)


Buy this standard

Standard Technical specification · SIS-ISO/TS 25138:2011

Surface chemical analysis - Analysis of metal oxide films by glow discharge optical emission spectrometry (ISO/TS 25138:2010, IDT)
Subscribe on standards - Read more Dölj
Price: 1 197 SEK
standard ikon pdf

PDF

Price: 1 197 SEK
standard ikon

Paper

Price: 1 915,20 SEK
standard ikon pdf + standard ikon

PDF + paper

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Product information

Language: English

Written by: SIS - Materialteknik

International title:

Article no: STD-76217

Edition: 1

Approved: 1/3/2011

No of pages: 48

Replaced by: SIS-ISO/TS 25138:2019