Standard IEC standard · IEC 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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Standard IEC standard · IEC 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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Omfattning
IEC 60749-4:2017(E) provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition: a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1; b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage; c) allowance of additional time-to-test delay or return-to-stress delay.

Ämnesområden

Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60749-4:2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Prenumerera på standarden - Läs mer Dölj
Pris: 520 SEK
standard ikon pdf

PDF

Pris: 520 SEK
standard ikon

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Produktinformation

Språk: Engelska

Framtagen av: IEC

Internationell titel: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Artikelnummer: STD-8025326

Utgåva: 2

Fastställd: 2017-03-03

Antal sidor: 9

Ersätter: IEC 60749-4:2002/COR1:2003 , IEC 60749-4:2002