Standard IEC standard · IEC 60749-21:2004

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

Status: Withdrawn

· Replaced by: IEC 60749-21:2011
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Standard IEC standard · IEC 60749-21:2004

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
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Scope
Establishes a standard procedure for determining the solderability of device package terminations that are intended to be joined to another surface using tin-lead or lead-free solder for the attachment. Provides a procedure for 'dip and look' solderability testing of through hole, axial and surface mount devices as well as an optional procedu

Subjects

Semiconductor devices (31.080) General (31.080.01)


Buy this standard

Standard IEC standard · IEC 60749-21:2004

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Subscribe on standards - Read more Dölj
Price: 520 SEK
standard ikon pdf

PDF

Price: 520 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: IEC

International title:

Article no: STD-566609

Edition: 1

Approved: 3/15/2004

No of pages: 20

Replaces: IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996

Replaced by: IEC 60749-21:2011