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Standard IEC standard · IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Status: Valid

· Corrected by: IEC 60749-8:2002/COR1:2003 , IEC 60749-8:2002/COR2:2003
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Standard IEC standard · IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
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Scope
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.

Subjects

General (31.080.01)

Buy this standard

Standard IEC standard · IEC 60749-8:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 1 040 SEK
standard ikon pdf

PDF

Price: 1 040 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-559956

Edition: 1

Approved: 8/30/2002

No of pages: 31

Replaces: IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996