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Standard IEC standard · IEC 60749-13:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Status: Withdrawn

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Standard IEC standard · IEC 60749-13:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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Scope
Modification of the validity date: now put at 2007.

Subjects

General (31.080.01)

Buy this standard

Standard IEC standard · IEC 60749-13:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 0 SEK
standard ikon pdf

PDF

Price: 0 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-565960

Edition: 1

Approved: 8/13/2003

No of pages: 0

Correction: IEC 60749-13:2002